2 - D A Y W O R
K S H O P
Metrics that Matter to R&D
Rapidly
Deploying a Comprehensive
and Simple R&D Metrics System
Dates & Location:
June
24-25, 2008 / Chicago, IL
A two-day executive workshop on how
to measure what really matters to improve R&D effectiveness and
significantly increase bottom line results. |
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Wayne Mackey
Principal
Product Development Consulting
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Internationally
Recognized Expert in Metrics and co-author of the best-selling
book,
Value Innovation
Portfolio Management: Achieving Double-Digit Growth through
Customer Value and co-author of the PDMA Toolbook for
Product Development III |
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"Wayne Mackey's approach to metrics
is focused on simplicity. That means simple to support, simple to
understand, and simple to communicate. Our experience with Wayne's
system has been that we can quickly establish metrics that are
useful to the business immediately."
Donald M. DeLauder
Executive Director
Product Innovation and
Advanced Development
MEDRAD, Inc.
MORE TESTIMONIALS
By
attending this session, you
will learn to:
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Align company strategies with your
R&D organizational goals
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Incorporate the voice of the
customer and organizational competencies into predictive
measures of success
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Systematically reduce the
"massively many" R&D metrics down to the "critical few"
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Differentiate R&D metrics for
executive, management and implementation levels
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Define everyday R&D operating
targets and establish a simple, effective review system
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